http://nifeeds.ni.com/s?px_cs=data%26px_code=search%26px_path=rss%3Fnistype%3Drss%26filter%3DFQL%253A%2528title%253A%2522semiconductor%2Btest%2522%2BOR%2Bdescription%253A%2522semiconductor%2Btest%2522%2BOR%2Bkeywords%253A%2522semiconductor%2Btest%2522%2BOR%2Bheadings%253A%2522semiconductor%2Btest%2522%2529%2B%2BAND%2Bnilanguage%253Aen%2BAND%2Bnicontenttype%253A%2528tutorial%2BOR%2Bexample%2BOR%2Bprenticehall%2BOR%2Btextbook%2BOR%2Bwebcastsondemand%2BOR%2Bvideos%2BOR%2Bproductdatasheet%2BOR%2Bdemos%2BOR%2Bpressrelease%2BOR%2Binstrumentationnewsletter%2BOR%2Bninews%2BOR%2Bcasestudy%2BOR%2Bblog%2BOR%2Bdemo%2529%2BANDNOT%2Burl%253Atacs%26sortby%3Ddate%26sortorder%3Ddescending%26nresults%3D10 http://www.ni.com/ Search results from ni.com en Copyright 2007, National Instruments http://www.ni.com/images/legal/us/nilogo2.gif http://www.ni.com/ 126 44 National Instruments https://decibel.ni.com/content/groups/ni-news-in-real-time/blog/2012/04/24/new-ni-pxi-solid-state-switch-boosts-rf-test-speed-and-system-life?nisrc=RSS-semicond-en Today NI introduced the new NI PXI/PXIe-2543 solid-state switch module, which gives engineers faster switching and an unlimited mechanical lifetime for routing RF signals up to 6.6 GHz. Thu, 19 Apr 2012 13:58:34 -0600 http://sine.ni.com/cs/app/doc/p/id/cs-14361?nisrc=RSS-semicond-en Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests. Thu, 15 Dec 2011 11:06:53 -0600 http://zone.ni.com/wv/app/doc/p/id/wv-2865?nisrc=RSS-semicond-en Listen as Charles Schroeder and Rolando Ortega introduces the PXIe-4141 4-Channel Precision SMU With NI SourceAdapt Technology which makes faster, more stable measurements, the NI PXIe-5186 5 GHz, 12.5 GS/s Digitizer, and the NI PXIe-6556 200 MHz Digital Waveform Generator/Analyzer with per pin Mon, 15 Aug 2011 09:53:20 -0600 http://zone.ni.com/devzone/cda/pub/p/id/1397?nisrc=RSS-semicond-en Introducing the 14 GHz NI PXIe-5665 RF Vector Signal Analyzer An RF signal analyzer with industry-leading performance at frequencies as high as 14 GHz is not only hard to find, but... Tue, 2 Aug 2011 07:00:06 -0600 http://www.ni.com/white-paper/11387/en?nisrc=RSS-semicond-en Consumer Electronics Test Hardware-in-the-Loop Test Semiconductor Test RF and Communications Test Audio and Video Test Military Electronics Test Consumer Electronics Test   Mi... Thu, 22 Apr 2010 04:41:03 -0600 https://decibel.ni.com/content/groups/ni-news-in-real-time/blog/2010/03/23/ni-hosts-inaugural-semiconductor-test-summit?nisrc=RSS-semicond-en National Instruments Taiwan today is hosting the inaugural Semiconductor Test Summit in Taipei. Industry leaders including Teradyne, Chroma, Tektronix, ON Semiconductor and Sunplus are on hand to discuss the use of PXI for semiconductor test. Nearly 500 engineers are expected to attend the event. Tue, 23 Mar 2010 09:55:24 -0600 http://www.ni.com/white-paper/10457/en?nisrc=RSS-semicond-en This year, more than ever, semiconductor engineers are doing more with less.  A recent EE Times article predicts that semiconductors ticketed for electronics equipment won’t r... Tue, 10 Nov 2009 05:00:03 -0600 http://zone.ni.com/wv/app/doc/p/id/wv-1684?nisrc=RSS-semicond-en National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for both characterization and production environments. PXI and LabVIEW offer a flexible platform for Tue, 4 Aug 2009 14:11:10 -0600 http://sine.ni.com/nips/cds/view/p/lang/en/nid/207106?nisrc=RSS-semicond-en Purchase or customize a pre-configured PXI system designed for testing MEMS devices Mon, 18 May 2009 18:00:00 -0600 http://sine.ni.com/nips/cds/view/p/lang/en/nid/207105?nisrc=RSS-semicond-en Purchase or customize a pre-configured PXI system designed for testing Wireless ICs (RFICs) Mon, 18 May 2009 18:00:00 -0600